Institutionen der Universität Bayreuth
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Gleißner, Michael ; Nehmer, Dominik ; Bakran, Mark-M.:
Junction Temperature Measurement Based on the Internal Gate Resistance for a Wide Range of Power Semiconductors.
In: IEEE Open Journal of Power Electronics.
Bd. 4
(2023)
.
- S. 293-305.
ISSN 2644-1314
DOI der Verlagsversion: https://doi.org/10.1109/OJPEL.2023.3265850
Häring, Johannes ; Hepp, Maximilian ; Wondrak, Wolfgang ; Bakran, Mark-M.:
A Neutral Point Balancing and Voltage Error Compensation Approach for Fault-Tolerant 3-Level Inverters.
In: IEEE Open Journal of Power Electronics.
Bd. 5
(2024)
.
- S. 106-122.
ISSN 2644-1314
DOI der Verlagsversion: https://doi.org/10.1109/OJPEL.2023.3347036
Maier, Robert ; Bakran, Mark-M.:
SiC MOSFET switching – Lower losses without increased EMI : A technique to evaluate and achieve this goal.
In: The Journal of Engineering.
(2022)
Heft 1
.
- S. 76-85.
ISSN 2051-3305
DOI der Verlagsversion: https://doi.org/10.1049/tje2.12099