Institutionen der Universität Bayreuth
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  Bergmann, Lukas ; Bakran, Mark-M.:
Design and validation of a novel semiconductor area optimised 3300 V SiC half bridge for MMC.
  
    
    In: IET Power Electronics.
      
      Bd. 17
      
      (2024)
       Heft  7
    .
     - S. 789-801.
    
    
ISSN 1755-4543
     
     DOI der Verlagsversion: doi:/10.1049/pel2.12693
  
  Gleißner, Michael ; Nehmer, Dominik ; Bakran, Mark-M.:
Junction Temperature Measurement Based on the Internal Gate Resistance for a Wide Range of Power Semiconductors.
  
    
    In: IEEE Open Journal of Power Electronics.
      
      Bd. 4
      
      (2023)
      .
     - S. 293-305.
    
    
ISSN 2644-1314
     
     DOI der Verlagsversion: https://doi.org/10.1109/OJPEL.2023.3265850
  
  Häring, Johannes ; Hepp, Maximilian ; Wondrak, Wolfgang ; Bakran, Mark-M.:
A Neutral Point Balancing and Voltage Error Compensation Approach for Fault-Tolerant 3-Level Inverters.
  
    
    In: IEEE Open Journal of Power Electronics.
      
      Bd. 5
      
      (2024)
      .
     - S. 106-122.
    
    
ISSN 2644-1314
     
     DOI der Verlagsversion: https://doi.org/10.1109/OJPEL.2023.3347036
  
  Maier, Robert ; Bakran, Mark-M.:
SiC MOSFET switching – Lower losses without increased EMI : A technique to evaluate and achieve this goal.
  
    
    In: The Journal of Engineering.
      
      (2022)
       Heft  1
    .
     - S. 76-85.
    
    
ISSN 2051-3305
     
     DOI der Verlagsversion: https://doi.org/10.1049/tje2.12099
  
  Nehmer, Dominik ; Ringelmann, Tim ; Bakran, Mark-M.:
Modelling and Evalaution of the Bidirectional Surge Current Robustness of Si(-IGBT and -Diode), SiC(-MOSFETs and -JFET) and GaN(-HEMTs) Devices.
  
    
    In: Energies.
      
      Bd. 17
      
      (2024)
       Heft  17
    .
    
     - 4362.
    
ISSN 1996-1073
     
     DOI der Verlagsversion: https://doi.org/10.3390/en17174362