Top dusted adhesive tape sample preparation method for the X-ray diffraction analysis of small powder sample volumes with the Bragg—Brentano setup

Titelangaben

Dickes, Daniel ; Glatzel, Uwe:
Top dusted adhesive tape sample preparation method for the X-ray diffraction analysis of small powder sample volumes with the Bragg—Brentano setup.
In: Journal of Applied Crystallography. Bd. 58 (2025) Heft 1 . - S. 276-282.
ISSN 1600-5767
DOI der Verlagsversion: https://doi.org/10.1107/S1600576724011920

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Abstract

When performing X-ray diffraction (XRD) analysis of small powder sample volumes with the Bragg—Brentano setup, choosing an appropriate sample preparation method is important. This work provides practical information on the conventional top dusted sample preparation method and the top dusted adhesive tape sample preparation method. In the latter, the powder of interest is dusted onto an adhesive tape. Because adhesive tapes contribute to the measured XRD signal as background noise, care must be taken when using a particular adhesive tape. This work assists XRD users in selecting the most suitable adhesive tape for their purpose by providing the diffractograms (Cuıt Kα\sb 1 radiation) of 13 commercially available adhesive tapes used for office and packing applications. In general, tapes with a matte acetate or polyvinyl chloride backing are recommended as they cause a comparatively low background signal without high-intensity reflections.