Publications "Nehmer, Dominik"
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Nehmer, Dominik ; Ringelmann, Tim ; Bakran, Mark-M.:
Modelling and Evalaution of the Bidirectional Surge Current Robustness of Si(-IGBT and -Diode), SiC(-MOSFETs and -JFET) and GaN(-HEMTs) Devices. In: Energies. Vol. 17 (2024) Issue 17 . - 4362. ISSN 1996-1073 DOI der Verlagsversion: https://doi.org/10.3390/en17174362
Gleißner, Michael ; Nehmer, Dominik ; Bakran, Mark-M.:
Junction Temperature Measurement Based on the Internal Gate Resistance for a Wide Range of Power Semiconductors. In: IEEE Open Journal of Power Electronics. Vol. 4 (2023) . - pp. 293-305. ISSN 2644-1314 DOI der Verlagsversion: https://doi.org/10.1109/OJPEL.2023.3265850 |