Publications "Nehmer, Dominik"

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Article in a journal

Gleißner, Michael ; Nehmer, Dominik ; Bakran, Mark-M.:
Junction Temperature Measurement Based on the Internal Gate Resistance for a Wide Range of Power Semiconductors.
In: IEEE Open Journal of Power Electronics. Vol. 4 (2023) . - pp. 293-305.
ISSN 2644-1314
DOI der Verlagsversion:

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