EPub Bayreuth
Publications "Nehmer, Dominik"
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Gleißner, Michael ; Nehmer, Dominik ; Bakran, Mark-M.:
Junction Temperature Measurement Based on the Internal Gate Resistance for a Wide Range of Power Semiconductors. In: IEEE Open Journal of Power Electronics. Vol. 4 (2023) . - pp. 293-305. ISSN 2644-1314 DOI der Verlagsversion: https://doi.org/10.1109/OJPEL.2023.3265850 |
