Publications "Nehmer, Dominik"

One level up ...
Export as [RSS feed] RSS 1.0 [RSS2 feed] RSS 2.0
Group by: Item Type | Year | No Grouping
Number of items: 1.

Article in a journal

file
Gleißner, Michael ; Nehmer, Dominik ; Bakran, Mark-M.:
Junction Temperature Measurement Based on the Internal Gate Resistance for a Wide Range of Power Semiconductors.
In: IEEE Open Journal of Power Electronics. Vol. 4 (2023) . - pp. 293-305.
ISSN 2644-1314
DOI der Verlagsversion: https://doi.org/10.1109/OJPEL.2023.3265850

This list was generated on Fri Jul 12 02:08:10 2024 CEST.
[Top of page]