Zeitschrift: IEEE Open Journal of Power Electronics

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Gleißner, Michael ; Nehmer, Dominik ; Bakran, Mark-M.:
Junction Temperature Measurement Based on the Internal Gate Resistance for a Wide Range of Power Semiconductors.
In: IEEE Open Journal of Power Electronics. Bd. 4 (2023) . - S. 293-305.
ISSN 2644-1314
DOI der Verlagsversion: https://doi.org/10.1109/OJPEL.2023.3265850

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Häring, Johannes ; Hepp, Maximilian ; Wondrak, Wolfgang ; Bakran, Mark-M.:
A Neutral Point Balancing and Voltage Error Compensation Approach for Fault-Tolerant 3-Level Inverters.
In: IEEE Open Journal of Power Electronics. Bd. 5 (2024) . - S. 106-122.
ISSN 2644-1314
DOI der Verlagsversion: https://doi.org/10.1109/OJPEL.2023.3347036